Measurement Capabilities

Measured parameters	S11, S21, S12, S22
Number of measurement channels	Up to 16 logical channels. Each logical channel is represented on the screen as an individual channel window. A logical channel is defined by such stimulus signal settings as frequency range, number of test points, power level, etc.
Data traces	Up to 16 data traces can be displayed in each channel window. A data trace represents one of the following parameters of the DUT: S-parameters, response in the time domain, or input power response.
Memory traces	Each of the 16 data traces can be saved into memory for further comparison with the current values.
Data display formats	Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR, real part, imaginary part, Smith chart format and polar format.

Sweep setup features
Sweep type	Linear frequency sweep, logarithmic frequency sweep, and segment frequency sweep, when the stimulus power is a fixed value; and linear power sweep when frequency is a fixed value.
Measured points per sweep	From 2 to the instrument maximum.
Segment sweep	A frequency sweep within several user-defined segments. Frequency range, number of sweep points, source power, and IF bandwidth can be set for each segment.
Power settings	Source power from instrument minimum to instrument maximum with resolution of 0.05 dB. In frequency sweep mode the power slope can be set to up to 2 dB/GHz to compensate high frequency attenuation in cables.
Sweep trigger	Trigger modes: continuous, single, hold. Trigger sources: internal, manual, external, bus.

Trace display functions
Trace display	Data trace, memory trace, or simultaneous data and memory traces.
Trace math	Data trace modification by math operations: addition, subtraction, multiplication or division of measured complex values and memory data.
Autoscaling	Automatic selection of scale division and reference level value to have the trace most effectively displayed.
Electrical delay	Calibration plane compensation for delay in the test setup, or for electrical delay in a DUT during measurements of deviation from linear phase.
Phase offset	Phase offset in degrees.

Accuracy enhancement
Calibration	Calibration of a test setup (which includes the Analyzer, cables, and adapters) significantly increases the accuracy of measurements. Calibration allows for correction of errors caused by imperfections in the measurement system: system directivity, source and load match, tracking, and isolation.
Calibration methods	The following calibration methods of various sophistication and accuracy enhancement are available:
Reflection and transmission normalization	The simplest calibration method. It provides limited accuracy.
Full one-port calibration	Method of calibration performed for one-port reflection measurements. It ensures high accuracy.
One-path two-port calibration	Method of calibration performed for reflection and one-way transmission measurements, for example for measuring S11 and S21 only. It ensures high accuracy for reflection measurements, and reasonable accuracy for transmission measurements.
Full two-port calibration	Method of calibration performed for full Sparameter matrix measurement of a two-port DUT. It ensures high accuracy.
TRL calibration (except Planar 304/1)	Method of calibration performed for full Sparameter matrix measurement of a two-port DUT. LRL and LRM types of this calibration are also supported. In ensures higher accuracy than a two-port calibration.
Mechanical calibration kits	The user can select one of the predefined calibration kits of various manufacturers or define additional calibration kits.
Electronic calibration modules	Copper Mountain Technologies’ automatic calibration modules make the Analyzer calibration faster and easier than traditional mechanical calibration.
Sliding load calibration standard	The use of sliding load calibration standard allows significant increase in calibration accuracy at high frequencies compared to a fixed load calibration standard.
Unknown thru calibration standard (except Planar 304/1)	The use of an arbitrary reciprocal two-port device instead of a zero-length thru during a full two-port calibration allows for calibration of the test setup for measurements of non-insertable devices.
Defining of calibration standards	Different methods of calibration standard definition are available:
Error correction interpolation	When the user changes such settings as start/stop frequencies and number of sweep points, compared to the settings of calibration, interpolation or extrapolation of the calibration coefficients will be applied.

Supplemental calibration methods
Power calibration	Method of calibration which allows for maintaining more stable power levels at the DUT input. An external power meter should be connected to the USB port directly or via USB/GPIB adapter.
Receiver calibration	Method of calibration which calibrates the receiver gain at absolute signal power measurement.

Marker functions
Data markers	Up to 16 markers for each trace. A marker indicates the stimulus value and measurement result at a given point of the trace.
Reference marker	Enables indication of any maker value as relative to the reference marker.
Marker search	Search for max, min, peak, or target values on a trace.
Marker search additional features	User-definable search range. Available as either a tracking marker, or as a one-time search.
Setting parameters by markers	Setting of start, stop and center frequencies from the marker frequency, and setting of reference level by the measurement result of the marker.
Marker math functions	Statistics, bandwidth, flatness, RF filter.
Statistics	Calculation and display of mean, standard deviation and peak-to-peak in a frequency range limited by two markers on a trace.
Bandwidth	Determines bandwidth between cutoff frequency points for an active marker or absolute maximum. The bandwidth value, center frequency, lower frequency, higher frequency, Q value, and insertion loss are displayed.
Flatness	Displays gain, slope, and flatness between two markers on a trace.
RF filter	Displays insertion loss and peak-to-peak ripple of the passband, and the maximum signal magnitude in the stopband. The passband and stopband are defined by two pairs of markers.

Data analysis
Port impedance conversion	The function converts S-parameters measured at the analyzer’s nominal port impedance into values which would be found if measured at a test port with arbitrary impedance.
De-embedding	The function allows mathematical exclusion of the effects of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.
Embedding	The function allows mathematical simulation of the DUT parameters after virtual integration of a fixture circuit between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.
S-parameter conversion	The function allows conversion of the measured S-parameters to the following parameters: reflection impedance and admittance, transmission impedance and admittance, and inverse S-parameters.
Time domain transformation	The function performs data transformation from frequency domain into response of the DUT to various stimulus types in time domain. Modeled stimulus types: bandpass, lowpass impulse, and lowpass step. Time domain span is set by the user arbitrarily from zero to maximum, which is determined by the frequency step. Various window shapes allow optimizing the tradeoff between resolution and level of spurious sidelobes.
Time domain gating	The function mathematically removes unwanted responses in time domain, allowing for obtaining frequency response without the influence of the fixture elements. The function applies a reverse transformation back to the frequency domain from the user-defined span in the time domain. Gating filter types: bandpass or notch. For better tradeoff between gate resolution and level of spurious sidelobes the following filter shapes are available: maximum, wide, normal and minimum.

Mixer / converter measurements
Scalar mixer / converter measurements	The scalar method allows measurement of scalar transmission S-parameters of mixers and other devices having different input and output frequencies. No external mixers or other devices are required. The scalar method employs port frequency offset when there is a difference between receiver frequency and source frequency.
Vector mixer / converter measurements	The vector method allows measuring of the mixer transmission S-parameter magnitude and phase. The method requires an external mixer and an LO common to both the external mixer and the mixer under test.
Scalar mixer / converter calibration	The most accurate method of calibration applied for measurements of mixers in frequency offset mode. The OPEN, SHORT, and LOAD calibration standards are used. An external power meter should be connected to the USB port directly or via USB/GPIB adapter.
Vector mixer /converter calibration	Method of calibration applied for vector mixer measurements. The OPEN, SHORT and LOAD calibration standards are used.
Automatic adjustment of frequency offset	The function performs automatic frequency offset adjustment when scalar mixer / converter measurements are performed to compensate for LO frequency inaccuracies internal to the DUT.

Other features
Familiar graphical user interface	Graphical user interface based on the Windows operating system ensures fast and easy Analyzer operation by the user.
Analyzer control	Using a personal computer.
Printout/saving of traces	The traces and data printout function has a preview feature. Previewing, saving and printing can be performed using MS Word, Image Viewer for Windows, or the Analyzer Print Wizard.

Remote control
COM/DCOM	Remote control via COM/DCOM. COM automation runs the user program on an Analyzer PC. DCOM automation runs the user program on a LAN-networked PC. Automation of the instrument can be achieved in any COM/DCOM-compatible language or environment, including Python, C++, C#, VB.NET, LabVIEW, MATLAB, Ocatve, VEE, Visual Basic (Excel) and many others.